| Issue |
J. Phys. IV France
Volume 04, Number C4, Avril 1994
3rd International Conference Laser M2P
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|---|---|---|
| Page(s) | C4-639 - C4-642 | |
| DOI | https://doi.org/10.1051/jp4:19944170 | |
3rd International Conference Laser M2P
J. Phys. IV France 04 (1994) C4-639-C4-642
DOI: 10.1051/jp4:19944170
1 Institut für Spektrochemie und Angewandte Spektroskipie, Dortmund, Germany
2 Institute of Spectroscopy, Russian Academy of Sciences, Troitzk, Russia
3 Institut für Physik, Universität Hohenheim, Stuttgart, Germany
© EDP Sciences 1994
J. Phys. IV France 04 (1994) C4-639-C4-642
DOI: 10.1051/jp4:19944170
Application of diode lasers for analysis
C. SCHNÜRER-PATSCHAN1, H. GROLL1, A. ZYBIN2 and K. NIEMAX1, 31 Institut für Spektrochemie und Angewandte Spektroskipie, Dortmund, Germany
2 Institute of Spectroscopy, Russian Academy of Sciences, Troitzk, Russia
3 Institut für Physik, Universität Hohenheim, Stuttgart, Germany
Abstract
Applications of semiconductor diode lasers to element analysis by laser atomic absorption spectrometry, isotope selective Doppler-free spectroscopy and laser induced fluorescence are discussed.
© EDP Sciences 1994