Sensing thermal conductivity and structural effects at the nanoscale by scanning thermal microscopy (SThM) M. Chirtoc, J. Gibkes, J.-S. Antoniow, J.-F. Henry, E. Neubauer, B. Bein et J. PelzlJ. Phys. IV France, 137 (2006) 265-271DOI: https://doi.org/10.1051/jp4:2006137053