| Numéro |
J. Phys. IV France
Volume 137, November 2006
|
|
|---|---|---|
| Page(s) | 265 - 271 | |
| DOI | https://doi.org/10.1051/jp4:2006137053 | |
| Publié en ligne | 23 décembre 2006 | |
J. Bodzenta, M. Dzida and T. Pustelny
J. Phys. IV France 137 (2006) 265-271
DOI: 10.1051/jp4:2006137053
Sensing thermal conductivity and structural effects at the nanoscale by scanning thermal microscopy (SThM)
M. Chirtoc1, J. Gibkes2, J.-S. Antoniow1, J.-F. Henry1, E. Neubauer3, B. Bein2 and J. Pelzl21 UFR Sciences, Lab. Thermophysique UTAP/LTP, Moulin de la Housse, BP. 1039, 51687 Reims Cedex 2, France
2 Institut für Experimentalphysik, Ruhr-Universität, 44801 Bochum, Germany
3 ARC Seibersdorf Research, Dept. Materials Research, 2444 Seibersdorf, Austria
(Published online 23 December 2006)
Abstract
We introduce the theoretical description of 
signal from
the Wollaston probe of a scanning thermal microscope (SThM) in terms
of an equivalent low-pass filter. We performed thermal conductivity
k measurements with lateral resolution of about 100 nm. The first
application concerns NiTi shape memory alloys microstructured by
focused ion beam implantation. Local martensite to austenite
structural phase transition has been identified upon heating the
sample from room temperature to 100
C. The
signal changes were -1.95% in amplitude and 0.6 in
phase, corresponding to thermal conductivity k increase of
13.5%. The second application consists of static measurement of
local k on points situated on flat faces of bare diamond
crystallites 300 
m in diameter, and on crystallites coated
with Cr, Cu and Cu/Cr layers with thickness in the range
0.5-30 m. The high k advantage of bare crystallites is
lost upon coating the particles, but the thermal barrier depends
also on the specific configuration when the particles are in contact
to one another in materials obtained from such powders.
© EDP Sciences 2006