| Numéro |
J. Phys. IV France
Volume 107, May 2003
|
|
|---|---|---|
| Page(s) | 1297 - 1300 | |
| DOI | https://doi.org/10.1051/jp4:20030538 | |
J. Phys. IV France 107 (2003) 1297
DOI: 10.1051/jp4:20030538
Multi physical-chemical profiler for real-time automated in situ monitoring of specific fractions of trace metals and master variables
M.-L. Tercier-Waeber1, F. Confalonieri2, G. Riccardi2, A. Sina2, F. Graziottin2 and J. Buffle11 CABE, Department of Inorganic and Analytical Chemistry, University of Geneva, Sciences Il, 30 quai E.-Ansermet, 1211 Geneva 4, Switzerland
2 Idronaut Sri, via Monte Amiata 10, 20047 Brugherio (MI), Italy
Abstract
State of the art in the development of a novel Multi Physical-Chemical profiler (MPCP system) for
simultaneous, autonomous, in situ measurements of three environmentally relevant specific fractions of trace metals
as well as master variables in natural waters is presented. It has been designed using advanced voltammetric
microsensors, microprocessor and telemetry technology. A detailed description of the system is given and examples
of environmental applications for in situ measurements in sea water are reported. The results indicate that the system
is reliable and that in situ measurements of the three specific fractions of trace metals can be achieved down to
concentrations at the ppt level using Square Wave Anodic Stripping Voltammetry (SWASV).
© EDP Sciences 2003