| Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
|---|---|---|
| Page(s) | 239 - 242 | |
| DOI | https://doi.org/10.1051/jp4:200300070 | |
J. Phys. IV France 104 (2003) 239
DOI: 10.1051/jp4:200300070
Depth-graded multilayers
Ch. Morawe1, J.-Ch. Peffen1 and I.V. Kozhevnikov21 European Synchrotron Radiation Facility, BP. 220, 38043 Grenoble cedex, France
2 Lebedev Physical Institute, Leninsky Prospect 53, 119991 Moscow, Russia
Abstract
We present first expérimental results on the fabrication and characterization of depthgraded
x-ray multilayers providing a broad and well-defined reflectivity profile. We have
designed and deposited irregular multilayer structures providing a practically constant reflectivity
of about 20% around the first Bragg-reflection and a bandwidth of about 20% in both incident
angle and photon energy. Detailed numerical simulations allow for the détermination of residual
errors in the layer stack.
© EDP Sciences 2003