Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
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Page(s) | 223 - 226 | |
DOI | https://doi.org/10.1051/jp4:200300066 |
J. Phys. IV France 104 (2003) 223
DOI: 10.1051/jp4:200300066
Focusing of hard X-rays using diamond and silicon refractive lenses
B. Nöhammer1, J. Hoszowska1, A. Freund1, A. Somogyi1, A. Simionovici1 and C. David11 Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, 5232 Villigen, Switzerland
Abstract
The fabrication and testing of planar refractive lenses made from diamond and silicon is reported. We obtained
efficiencies up to 78% and 31% for diamond and silicon lenses, respectively. A FWHM of the line-focus down to 3
m has been achieved for both types of lenses. Using two crossed silicon lenses in series 2-dimensional focusing has
been demonstrated, resulting in a micro focus of 7*14
m at 35 keV. This demonstrates the feasibility of silicon
lenses for micro-focusing applications at extreme photon energies (above approx. 30 keV). Due to the unique
physical properties of diamond, diamond lenses should be able to withstand the extreme flux densities expected at
future X-ray free electron lasers (X-FELs). This makes diamond refractive lenses very promising candidates for
applications at these 4
generation x-ray sources.
© EDP Sciences 2003