Numéro |
J. Phys. IV France
Volume 104, March 2003
|
|
---|---|---|
Page(s) | 71 - 76 | |
DOI | https://doi.org/10.1051/jp4:200300032 |
J. Phys. IV France 104 (2003) 71
DOI: 10.1051/jp4:200300032
A new magnetic type of X-PEEM
K. Yada1, M. Furudate2, K. Shinohara3, A. Ito4, Y. Yurimoto5 and M. Watanabe21 Tohken Co. Ltd., 2-27-7 Tamagawa, Chofu, Tokyo, Japan
2 Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Japan
3 University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, Japan
4 Tokai University, 1117 Kitakaname, Hiratuka, Japan
5 Tokyo Institute of Technology, 2-12-1 Ohokayama, Meguro-ku, Tokyo, Japan
Abstract
We construct a magnetic type of transmission photoemission electron microscope (PEEM) which is
similar in principle to a magnetic type of transmission X-PEEM called zooming tube developed by Hamamatsu
Photonics. We aim to realize higher resolution and much remarkable compactness by optimized electron optical
designs. The objective has tens parameters, Cs=8mm, Cc=7mm, fo=8mm, potential for photocathode
-l6kV and electric field strength in front of photocathode 5000V/mm. The microscope is tested by various
operation modes : TEM, X-PEEM (X-rays from Au-target and from BL12A at PF), UV-PEEM (He-Cd laser). A
Chevron type of MCP is mainly used as the image detector besides a fluorescent screen. TEM mode shows fairly
high resolution better than 40nm. The resolutions of X-PEEM and UV-PEEM deteriorate as compared with TEM
case showing a level of 200nm. It is proved with biological samples that the microscope has wavelength-scan
capability as expected, showing fairly high image quality.
© EDP Sciences 2003