| Numéro |
J. Phys. IV France
Volume 11, Numéro PR2, Juillet 2001
X-Ray Lasers 2000
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|
|---|---|---|
| Page(s) | Pr2-479 - Pr2-481 | |
| DOI | https://doi.org/10.1051/jp4:2001291 | |
7th International Conference on X-Ray Lasers
J. Phys. IV France 11 (2001) Pr2-479-Pr2-481
DOI: 10.1051/jp4:2001291
Institute of Applied Physics and Computational Mathematics, P.O. Box 8009-12, Zip Code 100088, P.R. China
© EDP Sciences 2001
J. Phys. IV France 11 (2001) Pr2-479-Pr2-481
DOI: 10.1051/jp4:2001291
Theoretical research of electron-density measurements of plane targets using soft XRL deflectometry
C. Ye, G. Zhang, T. Zhang, H. Peng and W. ZhengInstitute of Applied Physics and Computational Mathematics, P.O. Box 8009-12, Zip Code 100088, P.R. China
Abstract
In recent years, saturated Ne-like and Ni-like XRL were reached by double-pulse driving scheme using less energy. These provide convenient source for XRL applications. In this paper, we present calculations for experiments that measure electron-densities of plasmas produced by double-pulse laser with soft XRL moiré deflectometry. Using JB 19 code etc., we simulate the hydrodynamics of plane targets radiated by double-pulse laser, obtained the deflection angles of the probing beam for different times, and discuss the possibility of getting valuable information by XRL Moore deflectometry.
© EDP Sciences 2001