Dielectric response of ferroelectric liquid crystal thin layer

Abstract
In the thin layer of the SmC* phase the unwound twisted structure or the helical structure with the dechiralization lines can appear depending on the layer thickness and the sample processing. The thickness dependent dielectric response of both structures is calculated and compared. Within the model considered, the experimentally observed slower relaxation dynamics of the twisted structure as compared to the helical structure, is caused by the existence of weak depolarization fields.