Numéro |
J. Phys. IV France
Volume 08, Numéro PR2, June 1998
Soft Magnetic Materials 13
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Page(s) | Pr2-119 - Pr2-122 | |
DOI | https://doi.org/10.1051/jp4:1998228 |
Soft Magnetic Materials 13
J. Phys. IV France 08 (1998) Pr2-119-Pr2-122
DOI: 10.1051/jp4:1998228
1 Laboratorio de Magnetoóptica y Láminas Delgadas, Departamento de Física, Universidad de Oviedo, C/Calvo Sotelo, s/n, 33007 Oviedo, Spain
2 Bempflinger Str. 16, 72766 Reutlingen-Mittelstadt, Germany
© EDP Sciences 1998
J. Phys. IV France 08 (1998) Pr2-119-Pr2-122
DOI: 10.1051/jp4:1998228
Thermal evolution of magnetic properties of thin films having perpendicular anisotropy
R. Morales1, L.M. Álvarez-Prado1, G.T. Pérez1, F.H. Salas2 and J.M. Alameda11 Laboratorio de Magnetoóptica y Láminas Delgadas, Departamento de Física, Universidad de Oviedo, C/Calvo Sotelo, s/n, 33007 Oviedo, Spain
2 Bempflinger Str. 16, 72766 Reutlingen-Mittelstadt, Germany
Abstract
In this work we report on the temperature evolution (10K-470K)
of the magnetization processes of amorphous FexSi1-x thin films having perpendicular anisotropy.
The film thickness was close to 100 nm. Hysteresis loops show the estinction of stripe domains at a critical temperature
of Tc = 250K. In order to analyze possible changes in anisotropies (perpendicular and in-plane) throughout the film thickness,
we compare bulk properties measured by Alternating Gradient Magnetometer (AGM) with results obtained from MOKE at both
film interfaces.
© EDP Sciences 1998