| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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| Page(s) | C2-1263 - C2-1264 | |
| DOI | https://doi.org/10.1051/jp4:19972224 | |
J. Phys. IV France 7 (1997) C2-1263-C2-1264
DOI: 10.1051/jp4:19972224
Multielectron Excitations Above the Xenon L Edges
T. Tochio1, Y. Ito1, T. Mukoyama1, M. Takahashi2 and S. Emura21 Institute for Chemical Research, Kyoto University, Uji, Kyoto 611, Japan
2 The I.S.I.R., Osaka University, Mihogaoka 8-1, Ibaraki, Osaka 567, Japan
Abstract
The X-ray absorption cross section above the L edges in Xenon gas has been measured using synchrotron radiation. Multielectron excitation effects are investigated over a few hundred eV region from the Xe-LI, LII, and LIII edges and the contributions from the effects of shakeup and shakeoff to the photoabsorption spectrum are elucidated. Several features for the multielectron excitations were detected and analyzed by the theoretical energy of the shake up process. Previous observations of the [2(s,p)5(s,p)] and [2(s,p)4d] transitions have been confirmed. [2(s,p)4p], [2s4s], and [2s3d] transitions are clearly identified in the present study and the difference between the LI and LII, LIII edges for the change in slope of the absorption curve in passing through the three identified two-electron excitations is investigated.
© EDP Sciences 1997