Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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Page(s) | C2-137 - C2-140 | |
DOI | https://doi.org/10.1051/jp4/1997133 |
J. Phys. IV France 7 (1997) C2-137-C2-140
DOI: 10.1051/jp4/1997133
XAFS and Thermal Averaging
E.A. SternDepartment of Physics, Box 351560, University of Washington, Seattle, WA 98195, U.S.A.
Abstract
XAFS measures ρ(r), the distribution of the magnitude r of the relative vector displacement f between
a center probe atom and its neighbors. The related ρ(r→) of the distribution of the vector distance between the probe
atom and its neighbors defines a pair potential V(r→) which is thermally averaged over the position of all of the
other atoms in the material being investigated. It is shown that there are subtle differences between ρ(r) and p(r→)
which lead to a new correction term to XAFS measurements necessary to obtain the correct thermal expansion of
interatomic distances. Besides measuring ρ(r), XAFS allows the determination of both ρ(r→) and V(r→) which include
σ2⊥ addition to the usual σ2x, the mean squared vibrational disorder perpendicular and along the line between the
average position of the pair of atoms, respectively.
© EDP Sciences 1997