| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
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|---|---|---|
| Page(s) | C2-717 - C2-722 | |
| DOI | https://doi.org/10.1051/jp4:1997218 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-717-C2-722
DOI: 10.1051/jp4:1997218
1 Institut für Physikalische Chemie und Elektrochemie, Heinrich-Heine-Universität Düsseldorf, Universitätsstr. 1, 40225 Düsseldorf, Germany
2 HASYLAB am DESY, Notkestr. 85, 22603 Hamburg, Germany
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-717-C2-722
DOI: 10.1051/jp4:1997218
An In Situ Reflection Mode Quick Scanning EXAFS Study of Anodic Oxide Layer Formation on Silver
D. Hecht1, P. Borthen1, R. Frahm2 and H.-H. Strehblow11 Institut für Physikalische Chemie und Elektrochemie, Heinrich-Heine-Universität Düsseldorf, Universitätsstr. 1, 40225 Düsseldorf, Germany
2 HASYLAB am DESY, Notkestr. 85, 22603 Hamburg, Germany
Abstract
The formation of anodic silver oxide layers was in situ investigated with time dependent extented X-ray absorption fine structure measurements in the external total reflection geometry. It is demonstrated for the first time that this EXAFS tool yielding near range order structural information about near surface regions is well suited for time resolved studies of electrode surfaces under electrochemical conditions. As examples, results obtained for the growth of oxide films on the silver surface are presented as well as changes of the near range order structure of Ag2O-films induced by potentiostatic current transients.
© EDP Sciences 1997