WOLTE 2
Proceedings of the Second European Workshop on Low Temperature Electronics

J. Phys. IV France 06 (1996) C3-397-C3-401
DOI: 10.1051/jp4:1996360

S-Parameter Measurements of High-Temperature Superconducting and Normal Conducting Microwave Circuits at Cryogenic Temperatures

J. Lauwers¹, S. Zhgoon², N. Bourzgui³, B. Nauwelaers¹, J.C. Carru³ and A. Van de Capelle<sup>1

1</sup>  K.U. Leuven, Departement Electrotechniek, Afdeling ESAT/TELEMIC, Kard. Mercierlaan 94, 3001 Heverlee, Belgium
²  Moscow Power Engineering Institute (MPEI), Dept. of Radioengineering Fundamentals, Krasnokazarmennaja 14, 105835 Moscow, E250, Russia
³  Institut d'Électronique et de Microélectronique du Nord (IEMN), Département Hyperfréquences et Semiconducteurs, BP 69, Cité Scientifique, Avenue Poincaré, 59652 Villeneuve d'Ascq, France

Abstract
A fixture is presented that accepts both normal and superconducting microstrip structures for S-parameter measurements. The use of small replaceable inserts and a compression contact for the strip makes the fixture especially suited for rapid prototype testing of microstrip circuits. The technique is explained and measurements at room temperature and at low temperatures are demonstrated.

© EDP Sciences 1996