Interests of synchrotron radiation for internal stress analysis

Abstract
The interest of the method of X-ray diffraction for residual stress measurement is in continuous progress due to the advances in theoretical research and the development of new equipment. Usually, the shift and broadening of a diffraction peak reveal respectively the macrostrain (or stress) and microstrain. The limits of the X-ray provided by classical tubes in laboratory are its low intensity, fixed wavelength and relatively poor optic and spectrum resolution. This paper is a review of the use and interest of the synchrotron radiation in internal stress or strain analysis.