| Numéro |
J. Phys. IV France
Volume 04, Numéro C7, Juillet 1994
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique |
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|---|---|---|
| Page(s) | C7-667 - C7-670 | |
| DOI | https://doi.org/10.1051/jp4:19947158 | |
8th International Topical Meeting on Photoacoustic and Photothermal Phenomena
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-667-C7-670
DOI: 10.1051/jp4:19947158
Instituto de Física "Gleb Wataghin", Universidade Estadual de Campinas, UNICAMP, 13083-970 Campinas, São Paulo, Brazil
© EDP Sciences 1994
8 ITMP3 / 8éme conférence internationale de photoacoustique et photothermique
J. Phys. IV France 04 (1994) C7-667-C7-670
DOI: 10.1051/jp4:19947158
Depth profile of ferromagnetic layered samples studied with photothermally modulated magnetic resonance
J.A. Romano, A.M. Mansanares, E.C. da Silva and H. VargasInstituto de Física "Gleb Wataghin", Universidade Estadual de Campinas, UNICAMP, 13083-970 Campinas, São Paulo, Brazil
Abstract
Depth profile analysis of a ferromagnetic layered sample composed of γ-Fe2O3 and CrO2 tapes were performed with photothermally modulated ferromagnetic resonance (PM-FMR). Those analysis were done by using phase-resolved and modulation frequency variation methods. The experiments showed the advantages of this technique over the conventional one. The dependency of the detected signal on the modulation frequency was also studied for single layer samples, thus determining the microwave-absorbing layer thickness of the tapes.
© EDP Sciences 1994