| Numéro |
J. Phys. IV France
Volume 04, Numéro C4, Avril 1994
3rd International Conference Laser M2P
|
|
|---|---|---|
| Page(s) | C4-709 - C4-709 | |
| DOI | https://doi.org/10.1051/jp4:19944187 | |
3rd International Conference Laser M2P
J. Phys. IV France 04 (1994) C4-709-C4-709
DOI: 10.1051/jp4:19944187
Centre d'Etudes de Saclay, DPE-SPEA, Bât. 391, Analytical Laser Spectroscopy Group, 91191 Gif-sur-Yvette, France
© EDP Sciences 1994
J. Phys. IV France 04 (1994) C4-709-C4-709
DOI: 10.1051/jp4:19944187
Laser-based atomic spectroscopy for trace analysis
P. MAUCHIENCentre d'Etudes de Saclay, DPE-SPEA, Bât. 391, Analytical Laser Spectroscopy Group, 91191 Gif-sur-Yvette, France
Without abstract
© EDP Sciences 1994
Première page de l'article
