Microstructure and texture in secondary recrystallized silicon steel

Abstract
Characteristic features of microstructure in secondary recrystallized grain oriented silicon steel containing MnS and AlN have been investigated. Since secondary recrystallization is markedly influenced by inhibitors and a small amount of solute elements, transmission electron microscopy has been used to characterize changes of the morphology of inhibitors by tin addition. The onset temperature of secondary recrystallization of the silicon steel is shown to be decreased by tin addition. Also tin addition tends to reduce the size of inhibitors, MnS and AlN, and thereby appears to reduce the size of primary recrystallized grains. These effects of tin addition on microstructure are consistent with the fundamental idea that reduction of the size of primary recrystallized grains generally decreases the onset temperature of the secondary recrystallization. Electron back scattering pattern measurement was also conducted to characterize microscopic texture of recrystallized grains. Clear {110}<001> texture evolution is confirmed in this silicon steel.