| Numéro |
J. Phys. IV France
Volume 06, Numéro C5, Septembre 1996
International Field Emission SocietyIFES'96 Proceedings of the 43rd International Field Emission Symposium |
|
|---|---|---|
| Page(s) | C5-291 - C5-295 | |
| DOI | https://doi.org/10.1051/jp4:1996547 | |
IFES'96
Proceedings of the 43rd International Field Emission Symposium
J. Phys. IV France 06 (1996) C5-291-C5-295
DOI: 10.1051/jp4:1996547
A New Electronic Detector for FIM and AP : Initial WoW Results
P.P. Camus1, 2, D.J. Larson1, 3, L.M. Holzman3 and T.F. Kelly1, 2, 31 Applied Superconductivity Center, University of Wisconsin, Madison, WI 53706, U.S.A.
2 Department of Materials Science and Engineering, University of Wisconsin, Madison, WI 53706, U.S.A.
3 Materials Science Program, University of Wisconsin, Madison, WI 53706, U.S.A.
Abstract
A new style of charge-separation position-sensitive detector has been tested which has similar cost benefits as other charge-separation devices but has an error-awareness capability to provide an increased collection rate. The wedge-on-wedge anode is similar to the wedge-and-strip anode except that the four electrodes possess both wedge and strip character. This provides additional charge information such that a plurality of positional equations occurs. This provides an error-awareness condition if multiple arrivals strike the detector. Initial results of the wedge-on-wedge detector for use as an electronic detector for imaging and analysis for atom probe microscopy are provided. These results indicate that this detector should perform adequately for atom probe microscopy.
© EDP Sciences 1996