J. Bodzenta, M. Dzida and T. Pustelny
J. Phys. IV France 137 (2006) 353-356
Investigation of sensibility of temperature response on selected parameters of multilayer structureZ. Suszynski, P. Majchrzak and L. Majchrzak
Faculty of Electronics and Computer Science, Koszalin University of Technology, Sniadeckich Street, 75-453 Koszalin, Poland
(Published online 23 December 2006)
In this paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were relative thickness of layer and quotient of effusivities of adjoined layers. The TLM method was used for the calculations.
© EDP Sciences 2006