J. Phys. IV France
Volume 137, November 2006
Page(s) 353 - 356
Publié en ligne 23 décembre 2006
35th Winter School on Wave and Quantum Acoustics
J. Bodzenta, M. Dzida and T. Pustelny
J. Phys. IV France 137 (2006) 353-356

DOI: 10.1051/jp4:2006137067

Investigation of sensibility of temperature response on selected parameters of multilayer structure

Z. Suszynski, P. Majchrzak and L. Majchrzak

Faculty of Electronics and Computer Science, Koszalin University of Technology, Sniadeckich Street, 75-453 Koszalin, Poland

(Published online 23 December 2006)

In this paper a method of analysis of sensibility of layered structure thermal impedance for changing of selected parameters values was presented. The parameters analysed were relative thickness of layer and quotient of effusivities of adjoined layers. The TLM method was used for the calculations.

© EDP Sciences 2006