Numéro |
J. Phys. IV France
Volume 137, November 2006
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Page(s) | 353 - 356 | |
DOI | https://doi.org/10.1051/jp4:2006137067 | |
Publié en ligne | 23 décembre 2006 |
35th Winter School on Wave and Quantum Acoustics
J. Bodzenta, M. Dzida and T. Pustelny
J. Phys. IV France 137 (2006) 353-356
DOI: 10.1051/jp4:2006137067
Faculty of Electronics and Computer Science, Koszalin University of Technology, Sniadeckich Street, 75-453 Koszalin, Poland
(Published online 23 December 2006)
© EDP Sciences 2006
J. Bodzenta, M. Dzida and T. Pustelny
J. Phys. IV France 137 (2006) 353-356
DOI: 10.1051/jp4:2006137067
Investigation of sensibility of temperature response on selected parameters of multilayer structure
Z. Suszynski, P. Majchrzak and L. MajchrzakFaculty of Electronics and Computer Science, Koszalin University of Technology, Sniadeckich Street, 75-453 Koszalin, Poland
(Published online 23 December 2006)
Abstract
In this paper a method of analysis of sensibility of
layered structure thermal impedance for changing of selected parameters
values was presented. The parameters analysed were relative thickness of
layer and quotient of effusivities of adjoined layers. The TLM method was
used for the calculations.
© EDP Sciences 2006