J. Bodzenta, M. Dzida and T. Pustelny
J. Phys. IV France 137 (2006) 103-106
Shaping of coherence function of sources used in low-coherent measurement techniquesM. Jedrzejewska-Szczerska, B.B. Kosmowski and R. Hypszer
Department of Optoelectronics, Gdansk University of Technology, Narutowicza 11/12, Gdansk 80-952, Poland
(Published online 23 December 2006)
In low-coherent measurement techniques, such as: low-coherent interferometry, low-coherent reflectometry and low-coherent optical tomography, the coherence length of the source is one of the critical parameters of the designed system. The coherence length of the source effects the resolution of the measurement system. Commercially available low-coherent sources, as the most popular one - SLDs, have the coherence length at the range of 20-40 m. In many applications it is too little to get the required resolution of the measurement. Hence, it is necessary to use some techniques to change the coherence length of the source. It is possible to do so by shaping the spectral characteristic of the source. One of the most effective methods is to use a combination of a few properly chosen sources called synthesizing multiwavelength combination of sources.
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