J. Phys. IV France 126 (2005) 3-6
Investigations by X-ray topography of quartz and langasite resonatorsI. Mateescu1, B. Capelle2, J. Detaint2, G. Johnson3, E. Tsoi4 and C. Bran1
1 National Institute of Materials Physics, PO Box MG-7, Bucharest, Romania
2 University "Pierre et Marie Curie", 4 place Jussieu, 75252 Paris, France
3 Sawyer Research Products, 35400 Lakeland Blvd., Eastlake, Ohio 44095, USA
4 Institute of Microelectronics "Demokritos", 15310 Ag.Paraskevi, Athens, Greece
This paper presents the results of the X-ray topography investigations of mass-loading influence on electrical parameters of AT-cut quartz resonators and Y-cut langasite resonators. This study reveals that the mass-loading effect on electrical parameters of Y-cut langasite resonators is smaller than in the case of AT-cut quartz resonators. The results of the X-ray topography investigations are in good agreement with electrical measurements.
© EDP Sciences 2005