J. Phys. IV France
Volume 126, June 2005
Page(s) 3 - 6

J. Phys. IV France 126 (2005) 3-6

DOI: 10.1051/jp4:2005126001

Investigations by X-ray topography of quartz and langasite resonators

I. Mateescu1, B. Capelle2, J. Detaint2, G. Johnson3, E. Tsoi4 and C. Bran1

1  National Institute of Materials Physics, PO Box MG-7, Bucharest, Romania
2  University "Pierre et Marie Curie", 4 place Jussieu, 75252 Paris, France
3  Sawyer Research Products, 35400 Lakeland Blvd., Eastlake, Ohio 44095, USA
4  Institute of Microelectronics "Demokritos", 15310 Ag.Paraskevi, Athens, Greece

This paper presents the results of the X-ray topography investigations of mass-loading influence on electrical parameters of AT-cut quartz resonators and Y-cut langasite resonators. This study reveals that the mass-loading effect on electrical parameters of Y-cut langasite resonators is smaller than in the case of AT-cut quartz resonators. The results of the X-ray topography investigations are in good agreement with electrical measurements.

© EDP Sciences 2005