J. Phys. IV France
Volume 125, June 2005
Page(s) 349 - 353

J. Phys. IV France 125 (2005) 349-353

DOI: 10.1051/jp4:2005125082

Lens-free heterodyne transient grating technique

K. Katayama1, Q. Shen2, T. Toyoda2, M. Yamaguchi3 and T. Sawada4

1  Department of Chemistry, Massachusetts Institute of Technology, 77 Massachusetts Avenue, Cambridge MA 02139, USA
2  Department of Applied Physics and Chemistry, and Course of Coherent Optical Science, The University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan
3  Graduate School of Frontier Sciences, Department of Advanced Material Science, The University of Tokyo, 401, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan
4  Department of Chemical System Engineering, Tokyo University of Agriculture and Technology, 2-24-16 Nakamachi, Koganei, Tokyo 184-8588, Japan

Recently developed lens-free heterodyne transient grating technique was applied to samples with rough surfaces on the order of several microns and photo-induced transient responses were successfully obtained on the temporal order of picoseconds. It was shown that the limitation of the sample roughness considerably reduced, compared with other conventional ultrafast methods. Theoretically the sample roughness was allowed on the order of 100 microns under our experimental condition, while it is on the order of several hundreds nanometers using a transient grating method.

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