J. Phys. IV France
Volume 125, June 2005
Page(s) 101 - 104

J. Phys. IV France 125 (2005) 101-104

DOI: 10.1051/jp4:2005125023

New set-up to measure the thermal diffusivity with an infrared camera

C. Boué and D. Fournier

UPR A0005/UPMC/ESPCI, Lab. d'Optique Physique, 10 rue Vauquelin 75005 Paris, France

We present a new approach to measure the thermal diffusivity of materials. An infrared camera coupled with a "lock-in" system developed by CEDIP corporation detects the amplitude and the phase of the infrared emission on the surface of an heated sample. We show in this article that the thermal diffusivity can be calculated in all directions around the heating laser beam with the phase images more quickly than our conventional IR microscope system.

© EDP Sciences 2005