J. Phys. IV France 125 (2005) 97-100
Photothermal imaging of He+ ion implanted CdSM. Paulraj1, S. Ramkumar2, K.P. Vijayakumar1, C. Sudhakartha1 and K.G.M. Nair3
1 Department of Physics, Cochin University of Science and Technology, Kochi 682022, India
2 Rajagiri School of Engineering and Technology, Rajagiri Valley, Kakkanad, Kochi 682030, India
3 Material Science Division, Indira Gandhi Centre for Atomic Research, Kalpakkam 603102, India
CdS thinfilms implanted using He+ were studied using photothermal deflection spectroscopy (PTD) setup, using perpendicular pump-probe configuration. Samples were implanted with increasing ion energy so as to allow the ion to penetrate greater depths. An attempt for 2-dimensional imaging of implanted regions of different samples was carried out. Photothermal measurements were performed Samples were imaged for various modulation frequencies. Modulation frequency at 800 Hz revealed a maximum damaged layer, which corresponds approximately to the half the thickness.
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