Numéro |
J. Phys. IV France
Volume 124, Mai 2005
|
|
---|---|---|
Page(s) | 309 - 314 | |
DOI | https://doi.org/10.1051/jp4:2005124045 |
J. Phys. IV France 124 (2005) 309-314
DOI: 10.1051/jp4:2005124045
Multiples defects analysis using Cartesian-axisymmetric transformations models for NDT systems
A. Diche1, H. Mohellebi1, M. Féliachi2 and G. Berthiau21 Département d'Électrotechnique, Université de Tizi-Ouzou, BP. 17 RP, 15000, Algeria
2 IREENA(LRTI.-IUT), CRTT, BP. 406, 44602 Saint-Nazaire Cedex, France
Abstract
The present work deals with the use of conformal mapping
method in order to analysis multiples axisymmetric defects using established
transformations models [1] for eddy current problems in non-destructive
testing (NDT) systems. The interest of such a transformation is the
generation of electromagnetic field for axisymmetric problem from only the
field distribution known in simpler 2D(x-y) geometry. The transformation
technique is applied to both geometry and electromagnetic field distribution
and validated by comparing the predicted results to reference data [4]. Then
multiples defects are investigated.
© EDP Sciences 2005