J. Phys. IV France
Volume 124, Mai 2005
Page(s) 309 - 314

J. Phys. IV France 124 (2005) 309-314

DOI: 10.1051/jp4:2005124045

Multiples defects analysis using Cartesian-axisymmetric transformations models for NDT systems

A. Diche1, H. Mohellebi1, M. Féliachi2 and G. Berthiau2

1  Département d'Électrotechnique, Université de Tizi-Ouzou, BP. 17 RP, 15000, Algeria
2  IREENA(LRTI.-IUT), CRTT, BP. 406, 44602 Saint-Nazaire Cedex, France

The present work deals with the use of conformal mapping method in order to analysis multiples axisymmetric defects using established transformations models [1] for eddy current problems in non-destructive testing (NDT) systems. The interest of such a transformation is the generation of electromagnetic field for axisymmetric problem from only the field distribution known in simpler 2D(x-y) geometry. The transformation technique is applied to both geometry and electromagnetic field distribution and validated by comparing the predicted results to reference data [4]. Then multiples defects are investigated.

© EDP Sciences 2005