J. Phys. IV France
Volume 117, October 2004
Page(s) 65 - 72

J. Phys. IV France 117 (2004) 65-72

DOI: 10.1051/jp4:2004117010

FT-IR/PAS in analysis of CD discs

J. Ryczkowski, S. Pasieczna and B. Peregryn

University of Maria Curie-Sklodowska, 20-031 Lublin, Poland

Compact disc (CD) represents new optical recording technology, and has the advantage of being able to record an enormous amount of data. Depending on the kind of CD (e.g., recordable - CD-R, rewritable - CD-RW) it is characterized by a different structure. Photoacoustic (PA) spectroscopy in an infrared region (FT-IR/PAS) was applied for the inspection of the surface of different CDs. Analyzed CD's samples were taken from polycarbonate substrate, recorded and non-recorded areas. Observed surface changes are due to recording process.

© EDP Sciences 2004