J. Phys. IV France
Volume 117, October 2004
Page(s) 25 - 28

J. Phys. IV France 117 (2004) 25-28

DOI: 10.1051/jp4:2004117005

Experimental verification of new configurations in the piezoelectric photothermal spectroscopy of semiconductor materials

L. Bychto1, M. Malinski1, J. Zakrzewski2, S. Legowski2 and H. Meczynska2

1  Technical University of Koszalin, 75-328 Koszalin, Poland
2  Nicolaus Copernicus University, 87-100 Torun, Poland

This paper presents the analysis of two experimental configurations applied in the piezoelectric spectroscopy method. The first configuration called `rear' is normally used in the field of piezoelectric spectroscopy. The second configuration called `front' is a new configuration analyzed by authors. In this paper both advantages and disadvantages of both configurations are described. In this paper both theoretical and experimental spectra measured in these two configurations are presented and compared.

© EDP Sciences 2004