J. Phys. IV France
Volume 107, May 2003
Page(s) 1297 - 1300

J. Phys. IV France
107 (2003) 1297
DOI: 10.1051/jp4:20030538

Multi physical-chemical profiler for real-time automated in situ monitoring of specific fractions of trace metals and master variables

M.-L. Tercier-Waeber1, F. Confalonieri2, G. Riccardi2, A. Sina2, F. Graziottin2 and J. Buffle1

1  CABE, Department of Inorganic and Analytical Chemistry, University of Geneva, Sciences Il, 30 quai E.-Ansermet, 1211 Geneva 4, Switzerland
2  Idronaut Sri, via Monte Amiata 10, 20047 Brugherio (MI), Italy

State of the art in the development of a novel Multi Physical-Chemical profiler (MPCP system) for simultaneous, autonomous, in situ measurements of three environmentally relevant specific fractions of trace metals as well as master variables in natural waters is presented. It has been designed using advanced voltammetric microsensors, microprocessor and telemetry technology. A detailed description of the system is given and examples of environmental applications for in situ measurements in sea water are reported. The results indicate that the system is reliable and that in situ measurements of the three specific fractions of trace metals can be achieved down to concentrations at the ppt level using Square Wave Anodic Stripping Voltammetry (SWASV).

© EDP Sciences 2003