J. Phys. IV France
Volume 104, March 2003
Page(s) 623 - 626

J. Phys. IV France
104 (2003) 623
DOI: 10.1051/jp4:20030157

Cluster analysis of soft X-ray spectromicroscopy data

C. Jacobsen1, M. Feser1, M. Lerotic1, S. Vogt2, J. Maser2 and T. Schäfer3

1  Department of Physics and Astronomy, SUNY Stony Brook, U.S.A.
2  Advanced Photon Source, Argonne National Laboratory, Argonne, IL, U.S.A.
3  Forschungszentrum Karlsruhe GmbH, 76021 Karlsruhe, Germany

We describe the use of principle component analysis (PCA) to serve as a prefilter for cluster analysis or pattern récognition analysis of soft x-ray spectromicroscopy data. Cluster analysis provides a method to group régions with common spectral features even if no prior knowledge of their spectra is available, such as in biology or environmental science.

© EDP Sciences 2003