J. Phys. IV France
Volume 104, March 2003
Page(s) 477 - 481

J. Phys. IV France
104 (2003) 477
DOI: 10.1051/jp4:20030126

X-ray magnetic microscopy for correlations between magnetic domains and crystal structure

G. Denbeaux1, E. Anderson1, B. Bates1, W. Chao1, J.A. Liddle1, B. Harteneck1, A. Pearson1, F. Salmassi1, G. Schneider1, P. Fischer2, T. Eimüller2, S. Taylor3, H. Chang3 and G.J. Kusinski4

1  Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.
2  Max-Planck-Institute for Metals Research, Stuttgart, Germany
3  Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California, U.S.A.
4  MMFX Tecnologies, Irvine, CA, U.S.A.

Accurately determining the resolution of x-ray microscopes has been a challenge because good test patterns for x-ray microscopy have been hard to make. We report on a sputter-deposited multilayer imaged in cross section as a test pattern with small features and high aspect ratios. One application of high-resolution imaging is magnetic materials. Off-axis bend magnet radiation is known to have a component of circular polarization which can be used for x-ray magnetic circular dichroism. We calculate the integrated circular polarization collected by the illumination optics in the XM-1 full-field x-ray microscope.

© EDP Sciences 2003