J. Phys. IV France
Volume 104, March 2003
Page(s) 17 - 20

J. Phys. IV France
104 (2003) 17
DOI: 10.1051/jp4:200300020

An X-ray diffraction microscope at the Advanced Photon Source

Z. Cai, B. Lai, Y. Xiao and S. Xu

Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, U.S.A.

An instrument capable of high-resolution spatial mapping of crystallographic phase, lattice strain, and lattice distortion with x-rays of energies from 6 to 20 keV has been constructed and commissioned at the 2-ID-D beamline of the Advanced Photon Source. By integrating a hard x-ray Fresnel zone-plate-based microprobe and a six-circle diffractometer, the instrument provides a spatial resolution better than 250 nm, angular resolution of diffractometer circles better than 0.0001 $^{\circ}$, angular repeatability of the sample circles better than 0.001 $^{\circ}$, and almost full accessibility to the entire reciprocal space. The microprobe employs 10 cm and 40 cm (focal length at 8 keV) zone plates to provide high and moderate focusing power, respectively. Each zone-plate assembly has two identical zone plates stacked together to provide higher efficiency for higher energy (up to 30 keV) applications. The x-ray diffraction microscope has been applied to studies of the microstructures of bicrystal-supported magnetoresistive films.

© EDP Sciences 2003