J. Phys. IV France
Volume 104, March 2003
Page(s) 11 - 15

J. Phys. IV France
104 (2003) 11
DOI: 10.1051/jp4:200300019

The 2-ID-B intermediate-energy scanning X-ray microscope at the APS

I. McNulty1, D. Paterson1, J. Arko1, M. Erdmann1, S.P. Frigo2, K. Goetze1, P. Ilinski1, N. Krapf3, T. Mooney1, C.C. Retch4, A.P.J. Stampfl5, S. Vogt1, Y. Wang6 and S. Xu1

1  Argonne National Laboratory, 9700 S. Cass Ave., Argonne, IL 60439, U.S.A.
2  Department of Physicsand Astronomy, Northern Arizona University, P.O. Box 6010, Flagstaff, AZ 86011, U.S.A.
3  Department of Physics, University of Chicago, Chicago, IL 60637, U.S.A.
4  Saint-Gobain Sekurit Deutschland, ZAF - PT, Glasstrasse 1, 52134 Herzogenrath, Germany
5  Physics Division, Australian Nuclear Science and Technology Organisation, Menai, NSW 2234, Australia
6  X-Radia Inc., 4075A Sprig Dr., Concord, CA 94520, U.S.A.

The intermediate-energy scanning x-ray microscope at beamline 2-ID-B at the Advanced Photon Source is a dedicated instrument for materials and biological research. The microscope uses a zone plate lens to focus coherent 1-4 keV x-rays to a 60 nm focal spot of 10 9 photons/s onto the sample. It records simultaneous transmission and energy-resolved fluorescence images. We have used the microscope for nanotomography of chips and microspectroscopy of cells.

© EDP Sciences 2003