J. Phys. IV France
Volume 104, March 2003
Page(s) 9 - 9

J. Phys. IV France
104 (2003) 9
DOI: 10.1051/jp4:200300018

Recent progress with high resolution X-ray microscopy at the XM-1

G. Denbeaux1, G. Schneider1, A. Pearson1, W. Chao1, B. Bates1, B. Harteneck1, D. Olynick1, E. Anderson1, P. Fischer2 and M. Juenger3

1  Center for X-Ray Optics, Lawrence Berkeley National Laboratory, Berkeley, Califomia, U.S.A.
2  Max-Planck Institute for Metals Research, Stuttgart, Germany
3  Department of Civil and Environmental Engineering, U.C. Berkeley, Berkeley, California, U.S.A.

Without abstract

© EDP Sciences 2003
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