Numéro
J. Phys. IV France
Volume 12, Numéro 9, November 2002
Page(s) 181 - 182
DOI http://dx.doi.org/10.1051/jp4:20020390


J. Phys. IV France
12 (2002) Pr9-181
DOI: 10.1051/jp4:20020390

X-ray diffraction study of the transient structure of sliding charge density waves in NbSe 3

H. Requardt1, D. Rideau2, R. Danneau2, A. Ayari3, F. Ya Nad3, 4, J.E. Lorenzo5, P. Monceau3, R. Currat2, C. Detlefs1, D. Smilgies1 and G. Grubel1

1  ESRF, BP. 220, 38043 Grenoble cedex, France
2  ILL, BP. 156,38042 Grenoble cedex, France
3  CRTBT-CNRS, BP. 166, 38042 Grenoble cedex, France
4  Institute for Radioengineering and Electronics, Moscow, Russia
5  Laboratoire de Cristallographie, CNRS, BP. 166, 38042 Grenoble cedex, France


Abstract
We present high resolution X-ray diffraction measurements on NbSe 3 of the charge-density-wave (CDW) relaxation from the deformation created by the sliding of the CDW. The data are taken in the temperature range 75 K < T < 10 5 K in the upper-CDW phase of NbSe, and cover spatial positions up to $8OO~\mu$m from the current contact. Convenient fits to the data are obtained by a stretched exponential decay profile yielding exponents $\mu$ in the range of 0.4-0.7 and relaxation time-scales $\tau$ of the order of 1-150 ms. becoming faster with increasing sample temperature and slowing down with increasing distance from the current contact.



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