J. Phys. IV France 11 (2001) Pr2-479-Pr2-481
Theoretical research of electron-density measurements of plane targets using soft XRL deflectometryC. Ye, G. Zhang, T. Zhang, H. Peng and W. Zheng
Institute of Applied Physics and Computational Mathematics, P.O. Box 8009-12, Zip Code 100088, P.R. China
In recent years, saturated Ne-like and Ni-like XRL were reached by double-pulse driving scheme using less energy. These provide convenient source for XRL applications. In this paper, we present calculations for experiments that measure electron-densities of plasmas produced by double-pulse laser with soft XRL moiré deflectometry. Using JB 19 code etc., we simulate the hydrodynamics of plane targets radiated by double-pulse laser, obtained the deflection angles of the probing beam for different times, and discuss the possibility of getting valuable information by XRL Moore deflectometry.
© EDP Sciences 2001