J. Phys. IV France
Volume 11, Numéro PR2, Juillet 2001
X-Ray Lasers 2000
Page(s) Pr2-321 - Pr2-324
7th International Conference on X-Ray Lasers

J. Phys. IV France 11 (2001) Pr2-321-Pr2-324

DOI: 10.1051/jp4:2001262

Frequency redistribution effect on emissivity and intensity of Ge22+ and C5+ X-ray lasers

D. Benredjem1, C. Mossé2, H. Guennou1, A. Sureau1, B. Talin2 and C. Möller1

1  Laboratoire de Spectroscopie Atomique et Ionique, Université Paris-Sud, Centre d'Orsay, bâtiment 350, 91405 Orsay cedex, France
2  Laboratoire de Physique des Interactions Ioniques et Moléculaires, Université de Provence, Centre de Saint-Jérôme, Case 232, 13397 Marseille cedex 20, France

This work concerns the effect of frequency redistribution on X-ray laser beams. The redistribution function, calculated by extending the frequency fluctuation model to 2-photon processes, shows coherent scattering and a redistributed contribution. The spectral emissivity, corrected in order to account for this effect, is calculated for X-ray lasers, the amplifier plasma being composed either of neon-like germanium ions or hydrogen-like carbon ions. The coupled radiative transfer equation and population equations are solved consistently, and the intensity of the X-ray laser output is given for two 3p-3s lines (19.6 and 23.6 nm) of neon-like germanium. We also study the variation with plasma length (i.e. line intensity) of the emissivity of the C5+ Balmer-[MAHT] lasing line. The physical conditions of the calculations are obtained from a modelling of experiments conducted at the Rutherford Appleton Laboratory.

© EDP Sciences 2001