J. Phys. IV France
Volume 10, Numéro PR10, September 2000
Rayons X et Matière
Page(s) Pr10-211 - Pr10-217
Rayons X et Matière

J. Phys. IV France 10 (2000) Pr10-211-Pr10-217

DOI: 10.1051/jp4:20001023

X-ray characterisation of size, strain and texture inhomogeneities in ultra fine grained copper processed by equal channel angular extrusion

A. Tidu1, F. Wagner1, W.H. Huang2, P.W. Kao2, C.P. Chang2 and T. Grosdidier1, 3

1  Laboratoire d'Étude des Textures et Applications aux Matériaux (LETAM), UMR 7074 du CNRS, ISGMP, 57012 Metz cedex 01, France
2  Institute of Material Science and Engineering, Sun Yat-sen University, Kaohsiung, 80424 Taiwan, China
3  Laboratoire d'Étude et Recherche sur les Matériaux et Propriétés des Surfaces (LERMPS), UTBM/ENIBe, BP. 449, 90010 Belfort cedex, France

This study gives a characterisation using X-rays of variations in texture and microstructure of copper billets obtained by the ECAE (Equal Channel Angular Extrusion) process. Billets were produced using the so-called route C with an extrusion angle of 120°. It is shown that a significant texture gradient is observed through the width of the ECAE processed billet. In addition, we demonstrate that the amount of micro-strain and the size of the coherently diffracting domains depend on which peak of a given family of planes is investigated as well as on the exact location in the sample.

© EDP Sciences 2000