J. Phys. IV France
Volume 09, Numéro PR10, December 1999
International Workshop on Electronic Crystals
Page(s) Pr10-23 - Pr10-26
International Workshop on Electronic Crystals

J. Phys. IV France 09 (1999) Pr10-23-Pr10-26

DOI: 10.1051/jp4:19991005

X-ray diffraction from pinned charge density waves

S. Rouzière1, S . Ravy2, S. Brazovskii3 and J.-P. Pouget2

1  Institute for Solid State Physics, University of Tokyo, Japan.
2  Laboratoire de Physique des Solides, UMR 8502 du CNRS, bâtiment 510, University Paris-Sud, 91405 Orsay cedex, France
3  Laboratoire de Physique Théorique et Modèles Statistiques, UMR 8626 du CNRS, bâtiment 100, Université Paris-Sud, 91406 Orsay cedex, France

We present an x-ray study of doped charge density waves systems. When a 2kf-charge density wave is strongly pinned to impurities, an interference effect gives rise to an asymmetry between the intensities of tlie +2kf and -2kf satellite reflections. Moreover, profile asymmetry of the satellite reflections indicates the existence of Friedel oscillations (FOs) around the defects. We have studied these effects in V- and W- doped blue bronzes. A syncrotron radiation study of the V-doped blue bronze clearly reveals the presence of FO around the V atoms.

© EDP Sciences 1999