| Numéro |
J. Phys. IV France
Volume 08, Numéro PR9, December 1998
2nd European Meeting on Integrated FerroelectricsEMIF 2 |
|
|---|---|---|
| Page(s) | Pr9-183 - Pr9-186 | |
| DOI | https://doi.org/10.1051/jp4:1998933 | |
2nd European Meeting on Integrated Ferroelectrics
EMIF 2
J. Phys. IV France 08 (1998) Pr9-183-Pr9-186
DOI: 10.1051/jp4:1998933
Institute of Solid State Physics, 8 Kengaraga, LV-1063 Riga, Latvia
© EDP Sciences 1998
EMIF 2
J. Phys. IV France 08 (1998) Pr9-183-Pr9-186
DOI: 10.1051/jp4:1998933
Piezoelectric response of pulsed laser deposited heterostructures PZT/YBCO, PLZT/YBCO
M. Tyunina, A. Sternberg, V. Zauls, M. Kundzinsh and I. ShorubalkoInstitute of Solid State Physics, 8 Kengaraga, LV-1063 Riga, Latvia
Abstract
Thin films of lead zirconate titanate (PZT) and La doped lead zirconate titanate (PLZT), coupled to layers of YBa2Cu3O7 (YBCO), were formed by pulsed laser deposition on MgO(100) substrates. Interferometric studies of piezoelectric response of the heterostructures were performed with respect to DC electrical bias and AC measurement frequency. The piezoelectric coefficient demonstrated a hysteresis, consistent with polarization switching and related to residual stress in PZT and PLZT films. A strong increase in the values of piezoelectric coefficient d33 from 15...30 pm/V up to 200...250 pm/V was found in both PZT and PLZT films with decrease in the measurement frequency from 1 kHz to 60 Hz.
© EDP Sciences 1998