J. Phys. IV France
Volume 08, Numéro PR2, June 1998
Soft Magnetic Materials 13
Page(s) Pr2-119 - Pr2-122
Soft Magnetic Materials 13

J. Phys. IV France 08 (1998) Pr2-119-Pr2-122

DOI: 10.1051/jp4:1998228

Thermal evolution of magnetic properties of thin films having perpendicular anisotropy

R. Morales1, L.M. Álvarez-Prado1, G.T. Pérez1, F.H. Salas2 and J.M. Alameda1

1  Laboratorio de Magnetoóptica y Láminas Delgadas, Departamento de Física, Universidad de Oviedo, C/Calvo Sotelo, s/n, 33007 Oviedo, Spain
2  Bempflinger Str. 16, 72766 Reutlingen-Mittelstadt, Germany

In this work we report on the temperature evolution (10K-470K) of the magnetization processes of amorphous FexSi1-x thin films having perpendicular anisotropy. The film thickness was close to 100 nm. Hysteresis loops show the estinction of stripe domains at a critical temperature of Tc = 250K. In order to analyze possible changes in anisotropies (perpendicular and in-plane) throughout the film thickness, we compare bulk properties measured by Alternating Gradient Magnetometer (AGM) with results obtained from MOKE at both film interfaces.

© EDP Sciences 1998