J. Phys. IV France 07 (1997) C5-501-C5-506
Fatigue Behavior of Ti-Ni-Cu Thin Wires SMEC.J. de Araújo1, 2, M. Morin1 and G. Guénin1
1 C.E.M.P.P.M, URA 341 du CNRS, INSA de Lyon, 20 avenue Albert Einstein, 69621 Villeurbanne cedex, France
2 Universidade Federal da Paraiba, DEM/CCT, Campina Grande-PB, Brazil
Practical applications of the Shape Memory Effect (SME) involves frequently repetitive operations. Therefore, it's essential to have knowledge of the properties behavior related to SME under working conditions. The thermomechanical fatigue of Ti-Ni-Cu thin wires loaded by static uniaxial tensile stress and submitted to thermal cycling has been studied. The test samples were cycled until failure in oil bath, cooled by this one and heated by electrical current. One modified Wöhler curve has been plotted and the influences of the applied stress and of the number of thermal cycles on the shape memory properties has been analyzed. It is shown that the martensitic transformation associated to SME changes according to stress level and/or number of thermal cycles. The degradation until failure of the Stress Assisted Two-way Memory Effect (SATWME) was set between 0 and 20% compared to initial value.
© EDP Sciences 1997