J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
Page(s) C2-325 - C2-326
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure

J. Phys. IV France 7 (1997) C2-325-C2-326

DOI: 10.1051/jp4/1997213

Total Electron Yield Detector Working at Low Temperature for Linear Dichroïsm Studies on Monocrystalline Samples

C. Revenant-Brizard1, J.R. Regnard1, 2, J. Mimault3, D. Duclos1 and J.J. Faix3

1  Département de Recherche Fondamentale sur la Matière Condensée/SP2M, CEA/Grenoble 17 rue des Martyrs, 38054 Grenoble cedex 9, France
2  Université Joseph Fourier, BP. 53X, 38041 Grenoble cedex, France
3  Laboratoire de Métallurgie Physique, SP2MI, Bd. 3, Téléport 2, BP. 179, 86960 Futuroscope cedex, France

Electron detection in EXAFS is commonly used at room temperature for thick samples (where transmission measurements are not possible) or nanostructures with high element concentrations (where fluorescence detection is not appropriate). Recently, a Total Electron Yield detector with He gas flow at atmospheric pressure working at liquid nitrogen temperature has been developed and successfully tested on the French CRG/TF beamline at ESRF. At 80 K, the substantial decrease of the dynamic part of the Debye-Waller (DW) factor enables to record EXAFS signals on a larger k range and hence to obtain better signal-to-noise ratio of the corresponding Fourier Transform. A variation of the temperature of the sample from 80 to 300 K can be performed to evaluate the vibrational and the structural part of the DW factors. Moreover, in order to get rid of Bragg peaks in the EXAFS signal in case of monocrystalline samples, a special 360° rotating sample holder has been designed. Finally, polarization studies for anisotropic systems may be realized by simply rotating the sample holder by 90° from the in-plane to the out-of-plane polarization sample geometry.

© EDP Sciences 1997