J. Phys. IV France
Volume 07, Numéro C1, Mars 1997
Page(s) C1-501 - C1-502

J. Phys. IV France 07 (1997) C1-501-C1-502

DOI: 10.1051/jp4:19971205

Jahn-Teller Effect of Cu-Ferrite Films by Solid Reaction

T. Tanaka1, M. Chiba2, H. Okimura3 and Y. Koizumi1

1  Department of Applied Physics, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259-12 Japan
2  Department of Material Science and Technology, Tokai University, 317 Nishino, Numazu, Shizuoka, 410-03 Japan
3  Department of Metallurgical Engineering, Tokai University, 1117 Kitakaname, Hiratsuka, Kanagawa, 259-12 Japan

Copper iron oxide (CuFe2O4 : Cu-ferrite) thin film was prepared on a glass substrate by vacuum evaporation and solid reaction, and annealed at 400 °C in the air. The obtained film was identified by X-ray diffraction analysis as Cu-ferrite film having a tetragonal lattice. The axial ratio (c/a) of the film was 1.507 and was larger than that of ASTM data because the lattice distortion of the films seems to be large by difference of a preparation method. The temperature dependence of the magnetization and conductivities of the film showed remarkable changes at about 360°C, which were considered to be caused by phase transition due to the Jahn-Teller effect.

© EDP Sciences 1997

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