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J. Phys. IV France 06 (1996) C4-781-C4-788
Applications of an Integrated XRF-XRD SpectrometerR. Yellepeddi, A. Bapst and D. Bonvin
ARL, En Vallaire, 1024 Ecublens, Switzerland
An X-ray spectrometer which effectively integrates X-ray fluorescence and X-ray diffraction in a single instrument has been developed. The instrument uses same X-ray excitation, sample position, vacuum tank and control systems for both XRF and XRD measurements. It is shown that flexible elemental analysis together with specific phase/compound analysis can be accomplished in a quantitative way using such an instrument. Various applications in industrial process and quality control are illustrated.
© EDP Sciences 1996