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J. Phys. IV France 06 (1996) C4-259-C4-266
Experimental Equipment for Studying the Residual Stresses Developed During High Temperature Reactions by X-Ray DiffractionF. Bernard, E. Sciora and N. Gerard
URA 23 du CNRS, Réactivité des Solides, University of Burgundy, BP. 138, 21004 Dijon, France
This paper describes a device dedicated to studyng, by X-ray diffraction the residual stresses developed on surface samples as a function of temperature and atmosphere conditions. The setup consists of : a.) an horizontal axis goniometer which allows the programmed positionning of the sealed X-ray source and of the linear detector. b.) a high temperature controlled atmosphere chamber Particular attention has been paid to the thermal stability up to 1200°C and the accurate position on the sample.
© EDP Sciences 1996