Numéro
J. Phys. IV France
Volume 118, November 2004
Page(s) 259 - 265
DOI https://doi.org/10.1051/jp4:2004118030


J. Phys. IV France 118 (2004) 259-265

DOI: 10.1051/jp4:2004118030

La diffraction des rayons X durs : un nouvel outil pour les géosciences. Application aux quartz naturels

P. Bastie1, G. Dolino1, B. Hamelin2 et N. Meisser3

1  Laboratoire de Spectrométrie Physique, BP. 87, 38402 Saint Martin d'Hères Cedex France
2  Institut Laue-Langevin, BP. 156X, 38042 Grenoble Cedex 9 France
3  Musée géologique et Institut de minéralogie et géochimie, UNIL, Lausanne Suisse


Abstract
The Institut Laue-Langevin hard X ray diffraction technique has been used to study natural quartz crystals from the Alps and Madagascar. The results are consistent with the known descriptions of these types of crystals. This technique presents the advantage to be directly related to the structural properties of the samples. These measurements show the interest of this non destructive technique, which allows global bulk analysis of centimeter size samples, in the field of mineralogy and geosciences. It completes information given by usual methods.



© EDP Sciences 2004