| Numéro |
J. Phys. IV France
Volume 7, Numéro C2, Avril 1997
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
|
|
|---|---|---|
| Page(s) | C2-1153 - C2-1154 | |
| DOI | https://doi.org/10.1051/jp4:19972169 | |
Proceedings of the 9th International Conference on X-Ray Absorption Fine Structure
J. Phys. IV France 7 (1997) C2-1153-C2-1154
DOI: 10.1051/jp4:19972169
1 US. Naval Research Laboratory, code 6342, Washington, DC 20375, U.S.A.
2 National Institute of Standards and Technology, Gaithesburg, MD 20899, U.S.A.
3 Instituto de Magnetismo Aplicado, Las Rozas, 28230 Madrid, Spain
4 CENIM-CSIC, 28040 Madrid, Spain
© EDP Sciences 1997
J. Phys. IV France 7 (1997) C2-1153-C2-1154
DOI: 10.1051/jp4:19972169
Mechanical-Alloying and Lattice Distortions in Ball-Milled CuFe
V.G. Harris1, K.M. Kemner1, B.N. Das1, J.C. Woicik2, P. Crespo3, A. Hernando3 and A. Garcia Escorial41 US. Naval Research Laboratory, code 6342, Washington, DC 20375, U.S.A.
2 National Institute of Standards and Technology, Gaithesburg, MD 20899, U.S.A.
3 Instituto de Magnetismo Aplicado, Las Rozas, 28230 Madrid, Spain
4 CENIM-CSIC, 28040 Madrid, Spain
Abstract
A least-square fitting analysis of EXAFS data collected from partially-crystallized Fe80B20 thin films (t=15
nm), using data collected from pure phase standards of the crystallization products, was found effective in determining the
relative atomic fraction of each crystalline phase present. This fitting scheme provides a means for the quantitative
treatment of crystallization and precipitation kinetics in thin films and multilayered structures.
© EDP Sciences 1997