| Numéro |
J. Phys. IV France
Volume 03, Numéro C6, Novembre 1993
International Symposium on (e,2e) Collisions, Double Photoionization and Related Processes(e,2e) '93 |
|
|---|---|---|
| Page(s) | C6-117 - C6-123 | |
| DOI | https://doi.org/10.1051/jp4:1993611 | |
International Symposium on (e,2e) Collisions, Double Photoionization and Related Processes
(e,2e) '93
J. Phys. IV France 03 (1993) C6-117-C6-123
DOI: 10.1051/jp4:1993611
1 Johns Hopkins University, Baltimore, MD 21218, U.S.A.
2 University of Maryland, College Park, MD 20742, U.S.A.
© EDP Sciences 1993
(e,2e) '93
J. Phys. IV France 03 (1993) C6-117-C6-123
DOI: 10.1051/jp4:1993611
Electron impact double ionization of neon
M.J. FORD1, J.P. DOERING1, J.W. COOPER2, M.A. COPLAN2 and J.H. MOORE21 Johns Hopkins University, Baltimore, MD 21218, U.S.A.
2 University of Maryland, College Park, MD 20742, U.S.A.
Abstract
Electron-impact double ionization from the valence shell of neon has been measured at an incident electron energy of 3662.5 eV. Double-coincidence (e, (3-1)e) measurements have been made between the scattered electron and each of the ejected electrons in turn, ejected energies were 10 eV and 90 eV, respectively, at ejection angles of 45, 60, 90, 120 and 135 degrees with respect to the incident electron beam. Absolute four-fold-differential cross-sections have been derived from the measured data and can be interpreted in terms of a fast, single-step, shake-off process.
© EDP Sciences 1993