LPCVD SiO2 Layers Prepared from SiH4 and O2 at 450 °C in a Rapid Thermal Processing Reactor C. Cobianu, J.B. Rem, J.H. Klootwijk, M.H.H. Weusthof, J. Holleman et P.H. Woerlee J. Phys. IV France, 05 C5 (1995) C5-1005-C5-1011 DOI: 10.1051/jphyscol:19955118